Rigid-flex circuits with raised features as IC test probes

U.S. Patent Number: 5339027

Abstract: A circuit testing fixture is provided in which a flexible membrane (17) is provided with raised features (25) on one side arranged in the pattern of contacts (65) on a device (63) to be tested and circuit means (26) connected to a probe card (12). On the opposite side of the membrane is a support form (58), (66), (70) that is clamped in position so that it acts as a pressure pad to planar bottom edge which may provide ridges (61) in back deflect the membrane outwardly. The support form has a of the raised features (25) on the membrane (17) or recesses (68) at that location. The support form also may have a flat bottom surface (71) and may be of soft compliant material or of rigid material.

Inventors: Woith; Blake F. (Orange, CA), Crumly; William R. (Anaheim, CA), Linder; Jacques F. (Rancho Palos Verdes, CA)

Assignee: Hughes Aircraft Company (Los Angeles, CA)

Application Number: 08/022,253

Issued: 1994-08-16

Expired: 2006-08-16

Classes: 324/754 ; 324/158.1

Field of search: 324/158P,158F,72.5

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