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Micropattern-forming material having a low molecular weight novolak resin, a quinone diazide sulfonyl ester and a solvent
U.S. Patent Number: 5380618
Abstract: A micropattern-forming, light sensitive resin composition is disclosed. The composition comprises (a) a novolak resin comprising a condensate between formaldehyde and a mixture of m-cresol and p-cresol with a m-cresol to p-cresol charging weight ratio of from 45/55 to 60/40, wherein the novolak resin has the following characteristics: (i) a dissolving rate of 20 to 800 .ANG./sec in an aqueous solution of tetramethylammonium hydroxide (TMAH) and an alkali activity of 0.131N, (ii) a weight average molecular weight of 1000 to 6000 calculated as polystyrene equivalent, and (iii) a non-exposed dissolving rate of equal to or more than 100 .ANG./sec in an aqueous solution of TMAH with an alkali activity of 0.262N; (b) a light-sensitive substance of 1,2-naphthoquinonediazide-4-sulfonyl ester, and (c) a solvent capable of dissolving the novolak resin and the light-sensitive substance; wherein the novolak resin, the light-sensitive substance, and the solvent are present in such amounts that a 1.0 micron thick resist formed of the material has an optical density at 382 nm of 0.1 to 0.4 .mu.m.sup.-1. Also described is a micropattern-forming process having the steps of: (1) spin coating a substrate with the light-sensitive resin composition; (2) drying the light-sensitive composition; (3) exposing the dried light-sensitive composition using deep UV having a wavelength not longer than about 320 nm; and (4) developing the exposed light-sensitive composition.
Inventors: Kokubo; Tadayoshi (Shizuoka, JP), Uenishi; Kazuya (Shizuoka, JP), Tan; Shiro (Shizuoka, JP), Ishii; Wataru (Shizuoka, JP)
Assignee: Fuji Photo Film Co., Ltd. (Kanagawa, JP)
Application Number: 08/230,020
Issued: 1995-01-10
Expired: 2007-01-10
Classes: 430/190 ; 430/165; 430/191; 430/192; 430/193
Field of search: 430/190,191,192,193,165
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