Circuit testing system

U.S. Patent Number: 5381417

Abstract: The present invention relates to the field of circuit assembly testing systems and provides improved systems and methods for debugging circuit test systems and diagnosing faults in circuit assemblies. An expert system derives possible root causes of test failures, predicts test results based on these possible root causes and uses factual observations to refute inconsistent hypothetical root causes. Tests useful in refuting inconsistent hypothetical root causes are devised and run automatically by the system.

Inventors: Loopik; Alex (Rijswijk, NL), Crook; David T. (Loveland, CO)

Assignee: Hewlett Packard Company (Palo Alto, CA)

Application Number: 08/008,472

Issued: 1995-01-10

Expired: 2007-01-10

Classes: 714/724 ; 702/117; 706/919; 716/4

Field of search: 364/579,580 371/15.1,22.1,27

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