IC measuring method

U.S. Patent Number: 5386189

Abstract: An IC measuring method including positioning a plurality of ICS, each having a plurality of circuit blocks performing different functions, selecting different circuit blocks in each of the plurality of ICs, measuring the test results from each of the selected circuit blocks, and selecting a different circuit block in each of the plurality of ICs for the next measurement. The circuit block selection is controlled by a matrix circuit or by physically shifting the positions of the ICs.

Inventors: Nishimura; Kazuhiro (Itami, JP), Ueda; Kiyotoshi (Itami, JP)

Assignee: Mitsubishi Denki Kabushiki Kaisha (Tokyo, JP)

Application Number: 07/916,719

Issued: 1995-01-31

Expired: 2007-01-31

Classes: 324/158.1 ; 324/73.1

Field of search: 324/73.1,158R,158.1,750 371/22.3,22.5,22.6,15.1,16.1 437/8 364/550.1

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