Adjustable fixture for use with a wire pull tester

U.S. Patent Number: 5686670

Abstract: A fixture for use with a wire pull tester that tests the strength of a bond between an electrical contact of a semiconductor device and a wire affixed to the electrical contact. The fixture comprises a device support, a mounting surface provided on the device support, and a port provided at the mounting surface. The device support includes a height adjustment mechanism. The mounting surface is configured to engage a surface of the semiconductor device and includes a port with which an air pressure differential is produced to maintain engagement between the mounting surface and the semiconductor device surface when a pull force provided by a wire pulling member of the tester is imparted to the wire affixed to the electrical contact of the semiconductor device.

Inventors: Vanderlip; Fredrick James (Tempe, AZ)

Assignee: VLSI Technology, Inc. (San Jose, CA)

Application Number: 08/752,908

Issued: 1997-11-11

Expired: 2005-11-11

Classes: 73/827

Field of search: 73/827,828

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