Semiconductor integrated circuit having test circuit

U.S. Patent Number: 6519728

Abstract: A semiconductor integrated circuit has a test circuit in which signal pad (15) to input a switching signal TM is formed on a non-mounting surface of a LSI and one group of signal pads (11 to 13) formed on the non-mounting surface and signal pads (16 to 18) formed on a mounting surface is selected based on a signal level of the switching signal TM.

Inventors: Tsujii; Toshiyuki (Tokyo, JP), Hyozo; Masahiko (Tokyo, JP)

Assignee: Mitsubishi Denki Kabushiki Kaisha (Tokyo, JP)

Application Number: 09/303,624

Issued: 2003-02-11

Expired: 2007-02-11

Classes: 714/727 ; 324/765

Field of search: 714/727,729,730,726,724,725 324/73,765,158.1 326/16,21 257/700,690,698,703 327/277,276,30

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