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Expired patents of:
International Business Machines Corporation

Displaying 2201 to 2250 of 2784 patents. (Retrieval took 0.016 seconds.)

 Patent TitleExpired:
2201.Testing system interconnections using dynamic configuration and test generation2005-04-01
2202.Common error protection code for data stored as a composite of different data formats2005-04-01
2203.Method for adding a graphical user interface to a command line application2005-04-01
2204.System and method to prevent the occurrence of a snoop push during read and write operations2005-04-01
2205.High density circuit connector2005-03-30
2206.Liquid metal matrix thermal paste2005-03-30
2207.Recording medium emergency release mechanism2005-03-30
2208.Domino to static circuit technique2005-03-27
2209.Apparatus for chemical vapor deposition of aluminum oxide2005-03-25
2210.Monolithic electronic modules--fabrication and structures2005-03-25
2211.Method of making buried strap trench cell yielding an extended transistor2005-03-25
2212.Method of forming a thermally activated noise immune fuse2005-03-25
2213.Thin film diode having large current capability with low turn-on voltages for integrated devices2005-03-25
2214.High voltage protected ohmmeter2005-03-25
2215.Objective lens with large field deflection system and homogeneous large area secondary electron extraction field2005-03-25
2216.Reduced power apparatus and method for testing high speed components2005-03-25
2217.Independent clock edge regulation2005-03-25
2218.Latch circuit with state-walk logic2005-03-25
2219.Method of resetting a CMOS amplifier2005-03-25
2220.Secure viewing of display units using an electronic shutter2005-03-25
2221.Illumination tailoring system using photochromic filter2005-03-25
2222.Optical system with reduced focus spot size2005-03-25
2223.Minimal recharge overhead circuit for domino SRAM structures2005-03-25
2224.Method and apparatus for reworking printed circuit boards using surface coating and selective removal of an electrically conductive material2005-03-25
2225.Thermally stable water soluble solder flux and paste2005-03-23
2226.Method for analyzing the addition agents in solutions for electroplating of PbSn alloys2005-03-23
2227.Extractor and deceleration lens for ion beam deposition apparatus2005-03-23
2228.Shadow ram cell having a shallow trench eeprom2005-03-23
2229.Touch panel display2005-03-23
2230.Vehicle for facilitating assembly verification test2005-03-20
2231.Collapsible interior partition system for use in a collapsible returnable container2005-03-20
2232.Device and method for protecting pins of an electrical component2005-03-20
2233.Broadband any point to any point switch matrix2005-03-20
2234.Externally provided control of an I2C bus2005-03-20
2235.High density and high current capacity pad-to-pad connector comprising of spring connector elements (SCE)2005-03-18
2236.Reaction chamber having in situ oxygen generation2005-03-18
2237.Composite magneto-optic memory and media2005-03-18
2238.System using induced current for contactless testing of wiring networks2005-03-18
2239.Removeable media drive unit with loader interlock to indicate presence of object2005-03-18
2240.Processing element for parallel array processor2005-03-18
2241.Learning machine synapse processor system apparatus2005-03-18
2242.Method and apparatus for assuring that multiple messages in a multi-node network are assured fair access to an outgoing data stream2005-03-18
2243.Cache testing using a modified snoop cycle command2005-03-18
2244.Hardware implemented locking mechanism for handling both single and plural lock requests in a lock message2005-03-18
2245.System and method for management of transient data storage mediums in an automated data storage library2005-03-18
2246.Portable system having data distribution and power distribution removably positioned within portable enclosure during shipping and adapted for repositioning within internal storage space during operation2005-03-18
2247.Co-sintered surface metallization for pin-join, wire-bond and chip attach2005-03-18
2248.Touch panel display2005-03-16
2249.Passivation of metal in metal/polyimide structure2005-03-16
2250.High speed tester2005-03-16

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