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Expired patents of:
United Microelectronics Corp.

Displaying 1 to 50 of 464 patents. (Retrieval took 2.537 seconds.)

 Patent TitleExpired:
1.Wafer conductive structure for preventing plasma damage2006-12-31
2.Trench isolation for semiconductor device with lateral projections above substrate2006-12-31
3.ROM device using a schuckly diode2006-12-29
4.Surrounding-gate flash memory having a self-aligned control gate2006-12-24
5.Method of fabricating dynamic random access memory2006-12-22
6.Method of forming a rugged polysilicon fin structure in DRAM2006-12-22
7.Method of fabricating flat-cell mask read-only memory (ROM) devices2006-12-08
8.Automated manufacturing plant for semiconductor devices2006-12-01
9.Diode-based semiconductor read-only memory device and method of fabricating the same2006-12-01
10.Static memory with improved write-recovery2006-11-29
11.Apparatus and method of filtering a signal utilizing recursion and decimation2006-11-24
12.VLSI process with global planarization2006-11-22
13.Method for decreasing the resistivity of the gate and the leaky junction of the source/drain2006-11-19
14.Via plug layout structure for connecting different metallic layers2006-11-19
15.Method for reliability testing of semiconductor IC2006-11-19
16.Rugged polysilicon process for DRAM capacitors2006-11-17
17.Method of measuring the threshold voltage of metal-oxide semiconductor field-effect transistors2006-11-17
18.Tungsten-plug process2006-11-15
19.Method for forming landing pad2006-11-12
20.Front stage process of a fully depleted silicon-on-insulator device and a structure thereof2006-11-05
21.Multi-level conduction structure for VLSI circuits2006-10-27
22.Surrounding-gate flash memory having a self-aligned control gate2006-10-15
23.Memory module having a two-transistor memory cell2006-10-15
24.Multilayer polysilicon gate self-align process for VLSI CMOS device2006-09-27
25.Method for forming capacitor of a DRAM having a wall protection structure2006-09-24
26.Method of fabricating a semiconductor read-only memory device for permanent storage of multi-level coded data2006-09-22
27.Semiconductor device for preventing process-induced charging damages2006-09-10
28.Method of fabricating multi-stage read-only memory semiconductor structural configuration2006-09-08
29.Un-interruptible power supply apparatus for diffusion furnace2006-09-08
30.Method of preventing fluorine ions from residing in a gate to result in boron ion penetration into a gate oxide2006-08-27
31.SOI device and method of fabrication2006-08-27
32.MOSFET device2006-08-20
33.Compact contactless trenched flash memory cell2006-08-18
34.Method of automatically defining a landing via2006-08-06
35.Method of reducing stress between a nitride silicon spacer and a substrate2006-08-06
36.Structure of a DRAM and a manufacturing process thereof2006-07-23
37.Method of making self-aligned bit-lines2006-07-23
38.Post-processing treatment of low dielectric constant material2006-07-23
39.Method of measuring thickness of a multi-layers film2006-07-21
40.Method of making 0.6 micrometer word line pitch ROM cell by 0.6 micrometer technology2006-07-19
41.Method of fabricating dynamic random access memories2006-07-09
42.Method of fabricating a bottom electrode2006-07-09
43.Method for forming inner-cylindrical capacitor without top electrode mask2006-07-02
44.Method for forming twin-tub wells in substrate2006-06-30
45.Method of forming a local interconnect contact opening2006-06-25
46.Process of fabricating NAND-structure flash EEPROM using liquid phase deposition2006-06-23
47.Method of fabricating buried contact2006-06-18
48.Method for cleaning interior of etching chamber2006-06-11
49.Process for evenly depositing ions using a tilting and rotating platform2006-06-09
50.Method for forming a semiconductor memory device with a capacitor2006-06-09

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